Airy Optics has world-class expertise in polarization design, analysis, and measurement. Polaris-M addresses the full range of polarization optical system challenges. Generality and completeness – with one raytrace, you will derive a full spectrum information needed to completely analyze any optical system.
Features
Ray Tracing
Polaris-M offers sequential, non-sequential, automated ray doubling, beaming dividing at beamsplitters and interfaces, and coherent ray trace with optical path lengths and E-fields.
Polarization Calculus
Polaris-M utilizes the polarization ray trace (PRT) matrix to track polarization effects at every surfaces. With the addition of 100 built-in functions for easy polarization calculation such as Fresnel polarization coefficients, Polaris-M offers a wide-range of polarization techniques.
Thin Films
Polaris-M has the ability to build thin films with our easy-to-use GUI or from our extensive thin film library.
RCWA
Polaris-M has many built-in functions designed to analyze the resulting polarization ellipses of rays or across the optical system. The software also allows for Jones and Mueller pupil plotting.
Crystal Optics Design
Polaris-M is capable of creating and analyzing crystal optics. During each ray tracing, biaxial and uniaxial crystals are taken into account. Additionally, Polaris-M has the ability to perform ray traces on optically active crystals.
Stress Birefringence
Polaris-M has the capability to analyze stress defined by closed form analytic expressions or data imported from MoldFlow® and Timon3D® CAD programs. Effect of stress birefringence on wavefronts, interferograms, and point spread functions can be calculated within Polaris-M.
Measured Polarization Elements
Polaris-M can integrate measured polarization data easily into optical systems for analysis.
Polarization Image Formation
Polaris-M has many built-in functions designed to analyze the resulting polarization ellipses of rays or across the optical system. The software also allows for Jones and Mueller pupil plotting.
Ready to be deployed in the full range of R&D environment
- Invention
- Design
- Optimization
- Analysis
- Tolerancing
- Scientific Testing
Integrated polarization features
Built from the ground up polarization algorithms
Source polarization, polarization sensitive components, and sensitive detection modules are seamlessly combined.
Full suite of polarization tools
- Fully developed Polarization Ray Trace (PRT) matrix
- Jones calculus
- Mueller calculus
- Polarization dependent transmission and reflection Fresnel coefficients
- Partial polarization, multiwavelength sources and partial coherence
- Large numerical analysis sources
- Polarization dependent Jones pupils, PSF’s, and MTF´s
- etc
Future-ready
Structure is very flexible. Additional calculation and analysis modules can be added quickly to build out proprietary applications.
Training and sample algorithms expedite engineers’ ability to learn software.
Full library of demonstration packages demonstrates the power of Polaris-M.
Calculation modules and applicability
Ideal and real polarizer models, retarders, and crystals
Coating modules
Birefringent 3D ray plotting
TIR polarization effects
Ideal gratings and integrated RWCA analysis
etc
Mathematica Integration
We want to create a cohesive statement of unity and power between Polaris-M and Mathematica.
Sophisticated development environment
5000 built-in functions
Reliable platform
Extensive documentation